Machine Vision Inspection Systems
ViTrox provides Total Machine Vision Solutions for semiconductor IC inspection. Our products include Mark, Lead & Package defects inspection systems for MLP, QFP, BGA, SOT, SC70, etc. We provide customized solutions for true 3D Lead Inspection, sub-pixel accuracy measurement systems, 4-in-1 integrated and high-speed on-the-fly vision systems. Our solutions are guaranteed to be cost-effective, innovative and installed worldwide by major semiconductor manufacturers.
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•Detectable orientation:
0°, 90°, 180° and 270°
•Rapid inspection cycle time
< 90ms
•Optional combinations with mark, lead and package inspection
Product range:
•Mark Orientation Vision/Multiple Template [MT] Mark Orientation Vision
•Mark Orientation Package Vision/MT Mark Orientation Package Vision
•Mark Lead Orientation Vision/MT Mark Lead Orientation Vision
•Orientation Vision
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•Caters for both ink/laser markings [mark vision]
•Rapid inspection cycle time < 20ms [10 char, high speed]
•Minimum detectable char defect size: 8 x 5 pixels
•Optional combinations with lead, package or orientation inspection [mark vision]
Product range:
•Mark Vision/MT Mark Vision
•Mark Lead Vision/MT Mark Lead Vision
•Mark Lead Package/MT Mark Lead Package Vision
•Mark Package Vision/MT Mark Package Vision
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•Detectable defects : scratches, contamination, chipped off, cracked, incomplete mold.
•Rapid inspection cycle time < 80ms [high speed]
•Optional combinations with lead, mark or orientation inspection
Product range:
•Mark Orientation Package Vision/MT
•Mark Lead Package/MT Mark Lead Package Vision
•Mark Package Vision/MT Mark Package Vision
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•In-tape inspection of markings with minimum pocket reflection
•Rapid inspection cycle time < 150ms [25 characters]
•Optional combinations with lead or package inspection
Product range:
•In-Pocket Mark Vision
•In-Pocket Mark Lead Vision
•In-Pocket Mark Lead Package Vision
•In-Pocket Mark Package Vision
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